ايبك قيم. Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

4, 6 , 1452-1458 2014 91-92, 4 , 244-247 2002
Materials Science and Technology; 4 42, 13 , 5837-5846 1971

com R3896 for visible spectral range CCD digital camera Proscan GmbH, Proscan Special Instruments Ltd.

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
17, Mapping Strains Using Electron Backscatter Diffraction
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34, 1 , 29-34 1995
de HS 101 H for visible spectral range Control program Proscan GmbH, Proscan Special Instruments Ltd 23, 11 , 597-599 1976
17, 11 , 2291-2300 1984 54, 3 , 1314-1322 1983

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